The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm （6"）Ø.

產(chǎn)品地址：北京市
廠商性質(zhì)：經(jīng)銷商
更新時(shí)間：2025-12-05
瀏覽次數(shù)：3684

聯(lián)系電話：010-82630761

產(chǎn)品詳情

The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm (6”)Ø. Unlike conventional fizeau interferometers, the GI20 can measure

non-reflective surfaces, ideal for analysing lapped and/or ground surfaces prior to final polishing. The interferogram is displayed on a LCD screen on the front of the unit.

• High precision flatness measurement of ground, lapped or semi-polished samples

• Measure 2μm per fringe with excellent clarity

• Surface roughness measurement from 1nm to 300nm Ra

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The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm （6"）Ø.

The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm (6”)Ø. Unlike conventional fizeau interferometers, the GI20 can measure

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